Patrick Schmidt

Dr. Schmidt has extensive experience in the design and implementation of custom optoelectronic solutions, ranging from single molecule fluorescence and atomic force microscope manipulation, to nondestructive wafer defect detection via photoluminescence. He leverages an in-depth knowledge of optics principles, programmatic hardware control and synchronization, simulation, and cutting-edge imaging techniques to build specialized platforms and expand the capabilities of existing optoelectronic systems.

Dr. Schmidt takes a multidisciplinary approach to problem solving with experience in physics, electrical engineering, molecular and cellular biology, and programming. During his years of performing research, each of these were applied to design, build, and program a custom combined fluorescence and atomic force microscope with FPGA-enabled active stabilization and synchronized scanning, allowing for visualization of specific molecular and cellular conformation changes under force at nanometer stability over a broad bandwidth.

After completing his doctorate, Dr. Schmidt applied his expertise in industry, employed as an R&D engineer for three years. He helped redesign the optics and automation of wafer inspection tools to allow higher illumination power and throughput and expanded imaging mode capabilities. In particular, his designs were included in the launch of a UV-capable photoluminescence inspection tool which, in addition to standard microscopy capabilities, allows nondestructive defect detection in silicon carbide wafers.

At Exponent, Dr. Schmidt performs failure analysis for electronics, optical safety testing, and creates custom data collection and analysis platforms. His software/programming tools include OpticStudio, LabVIEW, MATLAB, Python, SPICE, Arduino IDE, and SOLIDWORKS.