Eric P. Guyer, Ph.D., P.E.

Dr. Guyer's areas of expertise include the fracture mechanics and fatigue of bulk materials as well as thin-films, paints and protective coatings, and more generally, materials science (metallurgy, polymers, ceramics, and glass). He has experience investigating fracture and fatigue failures of boilers, turbines, plumbing components, jet engine components, chemical reactors, various consumer products, and medical devices including cochlear implants, drug delivery systems, sterile pouches, pacemakers, and stents.

Dr. Guyer has experience in failure analysis investigations of semiconductor materials and devices used for microelectronic, biomedical, or optical system applications including those in which the materials or devices are subjected to harsh environmental conditions (e.g., chemical mechanical planarization (CMP), or the human body). He is also an expert in the area of mechanical testing of films and protective coatings (e.g., interfacial adhesion, cohesion, fatigue, subcritical crack growth / stress corrosion cracking) as well as materials characterization techniques used for complex thin-film device structures.

Dr. Guyer also conducts failure analysis investigations of various paint and protective coating systems applied to a wide variety of steel, aluminum, plastic, brick and stucco structures such as railings, windows, fences, buildings as well as consumer products such as remote controls. He has experience with powder coatings as well as solvent and waterborne liquid paints.

Prior to joining Exponent, he was employed as a Senior Materials Engineer at Lockheed Martin’s Advanced Technology Center in Palo Alto (2000–2005). There he examined the oxidation kinetics of advanced high temperature ceramics and investigated the fracture, mechanical and optical properties of polymer thin-films. As an undergraduate, Dr. Guyer was employed as a co-op student by the Dow Chemical Corporation, where he examined controlled drug delivery mechanisms of biodegradable polymers. He also worked in a production plant where pharmaceutical grade polymers were manufactured.

Houle FA, Guyer EP, Miller DC, Dauskardt RH. Adhesion between template materials and UV-cured nanoimprint resists. J Vac Sci Technol 2007; B 25(4), July/August.

Joseph R, Guyer EP, Thelen R. Tired of watching paint dry? Metal Finishing Magazine 2007; April.

Guyer EP, Gantz J, Dauskardt RH. Aqueous solutions diffusion in hydrophobic nanoporous thin-film glasses. J Mater Res 2007; 22, 2007.

Guyer EP, Patz M, Dauskardt RH. Fracture of nanoporous methylsilsesquioxane thin-film glasses. J Mater Res 2006; 21(4).

Iacopi F, Travaly Y, Eyckens B, Waldfried C, Abell T, Guyer EP, Gage DM, Dauskardt RH, Sajavaara T, Houthoofd K, Grobet P, Jacobs P, Maex K. Short-ranged structural rearrangement and enhancement of mechanical properties of organosilicate glasses induced by ultraviolet radiation. J Appl Phys 2006; 99.

Guyer EP, Dauskardt RH. Effect of solution pH on subcritical crack growth in Low-k dielectric thin-films. J Mater Res 2005; 20(3):680–687.

Guyer EP, Dauskardt RH. Electrical technique for monitoring crack growth in thin-film fracture mechanics specimens. J Mater Res 2004; 19(11):3139–3144.

Guyer EP, Dauskardt RH. Fracture of nanoporous thin-film glasses. Nat Mater 2004; 3(1):53–55.

Guyer EP. The effects of aqueous solution chemistry on the fracture of nanoporous thin-films. Ph.D. Dissertation, Leland Stanford Junior University, Stanford, CA, 158 pp., 2004.

Conference Proceedings

Houle FA, Miller DC, Guyer EP, Dauskardt EP, Rice E, Hamilton J. Adhesion between template materials and UV-cured nanoimprint resists. Proceedings, SPIE, Vol. 6153, 2006.

Gage D, Guyer EP, Stebbins J, Cui Z, Al-Bayati A, Demos A, MacWilliams K, Dauskardt RH. UV curing effects on glass structure and mechanical properties of organosilicate Low-k thin films. Proceedings, 9th Annual IEEE International Interconnect Technology Conference, Burlingame, CA, June 2006.

Guyer EP, Dauskardt RH. Effect of porosity on reducing cohesive strength and accelerating crack growth in Ultra Low-k thin-films. Proceedings, 8th Annual IEEE International Interconnect Technology Conference, Burlingame, CA, June 2005.

Dauskardt RH, Guyer EP. Accelerated debonding and cracking in thin-film structures: Chemical reaction rate and loading effects. Proceedings, 11th International Conference of Fracture, Turin, Italy, March 2005.

Guyer EP, Dauskardt RH. Accelerated cracking of nanoporous thin-film glasses in aqueous environments. Proceedings, 206th Meeting of the Electrochemical Society Conference, Honolulu, HI, October 2004.

Guyer EP, Dauskardt RH. Accelerated crack growth of nanoporous Low-k glasses in CMP slurry environments. Proceedings, 7th IEEE International Interconnect Technology Conference, Burlingame, CA, June 2004.

Guyer EP, Dauskardt RH. Effect of aqueous solution chemistry on the accelerated cracking of lithographically patterned arrays of copper and nanoporous thin-films. Proceedings, Spring Materials Research Society Conference, Symposium F, San Francisco, CA, April 2004.

Guyer EP, Dauskardt RH. Effect of CMP slurry environments on subcritical crack growth in ultra Low-k dielectric materials. Proceedings, 6th Annual IEEE International Interconnect Technology Conference, Burlingame, CA, June 2003.

Presentations and Published Abstracts

Guyer EP. Adhesion of thin-films. Medical Device Task Force, Tempe, AZ, November 2006.

Guyer EP. Environmentally assisted crack growth in thin-films. Medical Device Task Force, Tempe, AZ, November 2006.

Guyer EP, Dauskardt RH. Effect of chemically active environments on accelerated crack growth in Low-k dielectric thin-films. Northern California Chapter of the American Vacuum Society CMP Users Group, Sunnyvale, CA, March 2004.

• Materials Research Society—MRS
• Electrochemical Society
• The Society for Protective Coatings—SSPC
• National Association of Corrosion Engineers—NACE
• American Society for Metals—ASM